Ieee Joseph F. Keithley Award in Instrumentation and Measurement ■ John Wood
T
he IEEE Joseph F. Keithley Award in Instrumentation and Measurement was established in 2000. Sponsored by Keithley I n st r u me nt s, I nc., it i s awarded to individuals or teams of up three persons for outstanding contributions in electrical measurements, taking into account the originality and quality of the work, its influence on other work in the field, the breadth of the contribution, and the standards or measurement instrumentation involved. In 2013, Dylan F. Williams was honored by the IEEE with the Joseph F. Keithley Award in Instrumentation and Measurement. The award recognizes Dylan’s contributions in microwave measurements, in particular, the development of traceable mismatch-corrected microwave scattering parameters and the applications of these corrections to timedomain waveform calibration and
John Wood (
[email protected]) is the editor-inchief of IEEE Microwave Magazine. Digital Object Identifier 10.1109/MMM.2013.2282764 Date of publication: 15 November 2013
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measurements. These developments and radio-frequency integrated-circuit have resulted in traceable approaches technology that makes low-cost wirefor the measurement and testing of less components possible. Dylan’s rigorous approach to scattermicrowave integrated circuits, crucial to the development ing-parameter calibration and measureof the RFICs and MMICs ment has also led to the development of t h at e n a bl e t o d ay ’s mismatch-corrected temporal waveform standards that account for voltages, curwireless devices. Dylan received his rents, and impedances [3], [4]. Working P h .D. i n e le c t r ic a l with colleagues, he built NIST’s first fully engineering from the functional electro-optic sampling sysUniversity of Califor- tem. His work in scattering-parameter nia, Berkeley, in 1986. He measurements then allowed that system joined the Electromagnetic to measure both temporal voltages and Fields Division of the National currents, for the precise and complete Institute of Standards and Technol- characterization of temporal waveform ogy (NIST) in 1989, where he develops standards. The calibrations developed at NIST based on this work electrical waveform and are now used to support microwave metrology. high-speed oscilloscope While working with NIST, and large-signal network he pioneered methods of analyzer measurements characterizing printed important to the digital transmission lines [6]–[8] design community and the and the development of microwave and telecomaccurate on-wafer scatmunications industries. tering-parameter calibraDylan has published tions [1], [5]. On-wafer more than 100 technical measu rements a l low papers and is a Fellow of direct testing of intethe IEEE. He is the recipigrated circuits in the lab Dylan F. Williams ent of the Department of or production line before being packaged and incorporated into Commerce Bronze and Silver Medals, products. His work has facilitated the development of monolithic-microwave (continued on page 24)
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achieved performances. Therefore, we need to develop measurements that are fit-for-purpose for these new developments in technology. This gives rise to research and development into new measurements and new measurement techniques. It is vital that the development of new measurement techniques keeps pace with the new technological developments in order to ensure that the new measurements are available as and when these new technologies need them. The focus of this issue of IEEE Microwave Magazine is “measurement”— in particular, measurement technologies that have been or are being provided to support future technological needs. There are five measurement-related articles in this issue. There is an article by Williams that describes some of the theoretical aspects that underpin measurements used at high frequencies. Then there is an article by Rumiantsev and Doerner that presents a short history of
Awards
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the Astin Measurement Science Award, two Electrical Engineering Laboratory’s Outstanding Paper Awards, three Automatic RF Techniques Group (ARFTG) Best Paper Awards, the ARFTG Automated Measurements Technology Award, the IEEE Morris E. Leeds Award, the European Microwave Prize, and, now, the 2013 IEEE Joseph F. Keithley Award. Dylan also served as editor of IEEE Transactions on Microwave Theory and Techniques from 2006 to 2010 and as the executive editor of IEEE Transactions on Terahertz Science and Technology. He now serves as chair of the Microwave Theory and Techniques Society Publications Committee.
References [1] D. F. Williams, A. C. Young, and M. Urteaga, “A prescription for sub-millimeter-wave transistor characterization,” IEEE Trans. Terahertz Sci. Technol., vol. 3, no. 4, pp. 433–439, Mar. 2013. [2] D. F. Williams, “500 GHz–750 GHz rectangularwaveguide vector-network-analyzer calibrations,” IEEE Trans. Terahertz Sci. Technol., vol. 1, no. 2, pp. 364–377, Nov. 2010.
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the development of on-wafer measurements, a critical technology that has enabled dramatic advancements to be made in areas such as RF microelectronics and nanotechnology. There are also articles by Horibe et al. and Ridler et al., describing some recent work aimed at providing accurate measurements at millimeter-wave and terahertz frequencies. Finally, there is an article by Roblin et al., that relates directly to challenges coming from wide bandwidth communications applications (via wireless portable devices such as smartphones and tablets). I hope you enjoy these measurementrelated articles and feel inspired by the work that is described in them. I will finish with a quote from another wellknown comic book hero—this time, its Buzz Lightyear, with the ultimate in quantitative catchphrases: “to infinity… and beyond!”…now, who’s going to measure that one for me?
[3] D. F. Williams, T. S. Clement, P. D. Hale, and A. Dienstfrey, “Terminology for highspeed sampling-oscilloscope calibration,” in Automatic RF Techniques Group Conf. Dig., Dec. 2006, vol. 68, pp. 9–14. [4] D. F. Williams, P. D. Hale, T. S. Clement, and J. M. Morgan, “Calibrated 200 GHz waveform measurement,” IEEE Trans. Microwave Theory Tech., vol. 53, no. 4, pp. 1384–1389, Apr. 2005. [5] D. F. Williams, C. M. Wang, and U. Arz, “An optimal vector-network-analyzer calibration algorithm,” IEEE Trans. Microwave Theory Tech., vol. 51, no. 12, pp. 2391–2401, Dec. 2003. [6] D. F. Williams and B. Alpert, “Causality and waveguide circuit theory,” IEEE Trans. Microwave Theory Tech., vol. 49, no. 4, pp. 615–623, Apr. 2001. [7] D. F. Williams, L. A. Hayden, and R. B. Marks, “A complete multimode equivalent-circuit theory for electrical design,” J. Res. Natl. Inst. Stand. Technol., vol. 102, no. 4, pp. 405–423, June 1997. [8] R. B. Marks and D. F. Williams, “A general waveguide circuit theory,” J. Res. Natl. Inst. Stand. Technol., vol. 97, no. 5, pp. 533–562, Sept. 1992.
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