Apr 11, 2016 - electron microscope (S/TEM) ... enable high energy-resolution electron energy-loss .... can be viewed simultaneously inside the browser.
New Products Andreas Mandelis Citation: Review of Scientific Instruments 87, 039501 (2016); doi: 10.1063/1.4943566 View online: http://dx.doi.org/10.1063/1.4943566 View Table of Contents: http://scitation.aip.org/content/aip/journal/rsi/87/3?ver=pdfcov Published by the AIP Publishing Articles you may be interested in New Products Rev. Sci. Instrum. 86, 099501 (2015); 10.1063/1.4930552 New Products Rev. Sci. Instrum. 86, 089501 (2015); 10.1063/1.4928120 New Products Rev. Sci. Instrum. 86, 049501 (2015); 10.1063/1.4917194 New Products Rev. Sci. Instrum. 84, 069501 (2013); 10.1063/1.4810013 Erratum: “New equipment and new technique for measuring activity coefficients and Henry's constants at infinite dilution” [Rev. Sci. Instrum.82, 025108 (2011)] Rev. Sci. Instrum. 82, 039902 (2011); 10.1063/1.3572261
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REVIEW OF SCIENTIFIC INSTRUMENTS 87, 039501 (2016)
New Products Andreas Mandelis Department of Mechanical and Industrial Engineering, University of Toronto, Center for Advanced Diffusion-Wave Technologies, 5 King’s College Road, Toronto, Ontario M5S 3G8, Canada (Received 26 February 2016; accepted 26 February 2016; published online 18 March 2016) In order to supplement manufacturers’ information, this Department will welcome the submission by our readers of brief communications reporting measurements on the physical properties of materials which supersede earlier data or suggest new research applications. [http://dx.doi.org/10.1063/1.4943566]
NEW INSTRUMENTS AND COMPONENTS
of Science, Suite 200, San Diego, California 92128. (858-432-7500) http://www.daylightsolutions.com
Rapid-scan continuous-wave (CW)–pulsed mid-infrared (IR) laser
Scanning transmission electron microscope (S/TEM)
A novel combination of high-quality CW or pulsed output, high power, and fast tuning speed, the Hedgehog tunable laser head from Daylight Solutions enables rapid data acquisition with high wavelength accuracy and repeatability. According to the company, the Hedgehog is the first mid-IR laser that offers both fast, broad tuning and high-fidelity output. Its high signal-to-noise ratio may benefit molecular spectroscopy applications needing fastscan mid-IR lasers that deliver high-quality light. The Hedgehog is built on Daylight’s quantum cascade laser (QCL) technology. Available center wavelengths span the mid-IR spectrum from 13 µm. It offers tuning speeds to >1000 cm−1/s, tuning ranges up to 400 cm−1, and average or peak powers up to 400 mW. The Hedgehog can operate in pulsed or CW modes; for the latter functionality, a CW-capable gain chip is required. Model options include high power, broad tuning, high wavelength repeatability, narrow linewidth, low noise, and multiple tuning modes. The compact Hedgehog’s small sealed head and rugged design make it suitable for either laboratory use or original equipment manufacturer integration. Each Hedgehog is shipped with an easy-to-use, compact SideKick multifunction QCL controller. Control is accomplished via universal serial bus (USB)/Ethernet connectivity and an included graphical user interface (GUI) and software development kit command set. Daylight’s proprietary high-fidelity QCL drive circuitry protects the QCL chip. The Hedgehog can be used in a wide range of molecular sensing applications, including process control, detection of pollutants and chemical and biological agents, time-resolved spectroscopy, and cellular imaging.—Daylight Solutions Inc., 15378 Avenue
According to JEOL, the versatile JEM-F200— or “F2”—model recently added to its TEM suite offers features not found in other non-aberrationcorrected TEMs. The F2 is the only advanced analytical, high-throughput 200-kV S/TEM in its class to offer a cold field emission gun (FEG) and dual silicon drift detectors (SDDs). JEOL states that the combined boost in probe current from the cold FEG with the dual energy-dispersive spectroscopy capability makes the system suitable for analytical investigations. The high brightness and narrow energy spread of JEOL’s cold-FEG enable high energy-resolution electron energy-loss spectroscopy (EELS) for rapid identification of chemical bonding states. The dual SDDs offer high sensitivity and throughput for x-ray analysis. The new advanced scan system employs “DeScan” to achieve wide-field STEM-EELS spectrum imaging. The F2 features a quad lens condenser system that independently controls electron beam intensity (spot size) and convergence angle. The F2 is stable and easy to operate. More than 100 beam conditions can be selected at the push of a button and prior settings easily recalled. An ECO mode saves power consumption. A new automated sample holder transfer system, the SpecPorter, simplifies sample loading. Once loaded, the PicoStage conducts precise, high-speed sample movements
0034-6748/2016/87(3)/039501/4/$30.00 87, 039501-1 © 2016 AIP Publishing LLC Reuse of AIP Publishing content is subject to the terms at: https://publishing.aip.org/authors/rights-and-permissions. Download to IP: 23.95.235.179 On: Mon, 11 Apr 2016 22:37:43
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of 0.5-nm steps, allowing users to move the field of view smoothly over a wide spatial scale range from millimeters to picometers.—JEOL USA, Inc., 11 Dearborn Road, Peabody, Massachusetts 01960. (978-535-5900) http://www.jeolusa.com
High-resolution atomic force microscopes (AFMs) According to the Applied Research and Development Integration Company (ARDIC), its recently released QScan, QScan Plus, and QScan Pro tapping mode AFMs allow users to quickly and easily produce subnanometer-resolution images. Designed to be suitable for the most frequently used tapping-mode imaging, the QScan series offers a 70-pm noise floor and an optical resolution better than 30 pm for consistently high-quality imaging results. The company’s proprietary optical detection system yields what it claims is the smallest spot size in the industry (0.56 µm), which very much simplifies tip alignment. Due to the perpetually aligned design, the optics need not be calibrated. ARDIC’s software automatically handles tip tuning and optimizes scan conditions by using predictive algorithms.—ARDIC/AEROTECH, 85 North Raymond Avenue, Pasadena, California 91103. (626209-9196) http://www.ardicinstruments.com
NEW DETECTORS, MEASUREMENTS, AND MATERIALS
Rev. Sci. Instrum. 87, 039501 (2016) SAXS/WAXS system can be applied to the study of various materials, including solids, liquids, liquidcrystals, and gels with ordered and disordered structures, and to diverse applications, including nanoparticle size distribution analyses, threedimensional protein molecule structure analyses, identification of molecular assembly or disassembly, and research into advanced materials such as carbon fiber-reinforced plastics. The system is configured with a high-brilliance, high-power point focus x-ray source; the OptiSAXS multilayer mirror; the ClearPinhole low-scattering pinhole slits; and the HyPix-3000 2D semiconductor detector that enables the detection of diffraction and scattering, even from anisotropic materials. Optionally, the HyPix-6000 detector is also available for wide-angle measurements, offering an expanded detection area by combining two detection modules. The sample-to-detector distance is changeable depending on the structure size, from atomic structure (microstructures 0.2–1 nm) to molecular structure (macrostructures 1–100 nm). Control of the measurement environment is essential for the research of structure–property relationships of functional materials. The NANOPIX system enables measurements under various temperature or humidity conditions, experiments with simultaneous differential scanning calorimetry measurements, and measurements in combination with special attachments or other external devices. The x-ray generator and the multilayer mirror optics are integrated into one beam module to deliver high stability and reproducibility. The system allows the distance between sample and x-ray detector to be changed: Several short vacuum paths connected between the sample and the detector can easily be inserted or removed using a vacuum path sliding function instead of moving them up or down. That improves operability and facilitates making measurements under the most suitable conditions. The NANOPIX SAXS/WAXS measurement system is fully motorized and controlled by software, which features a sensing function that enables the automatic recognition of sample attachments.—Applied Rigaku Technologies, Inc., 9825 Spectrum Drive, Building 4, Suite 475, Austin, Texas 78717. (512-225-1796) http://www.rigaku.com
ease of information interpretation. User interfaces are available in English, Chinese, Japanese, and Russian, and context-sensitive help is available for all functions. The 1919-R can provide either a real-time or an averaged measurement in watts, watts/area, joules, joules/area, or a unitless ratio against a reference value, depending on the detector types. When connected with a photodiode detector, the meter gives readings in watts and decibelmilliwatts. When connected with the company’s 919P series thermopile detector, it allows a power measurement in watts or a single-shot energy measurement in joules. When connected with one of Newport’s new 919E series pyroelectric detectors, it allows a pulse energy measurement in joules, average power in watts, or a total accumulated energy measurement over a set period of time. Since the 1919-R offers laser tuning, data logging, graphing, normalizing, statistics, userselectable display color, and mathematics functions in the power meter, users can run a complex experiment without going through a complex setup using a separate computer. The meter logs at up to 5000 Hz using pyroelectric sensors. It offers various data presentation methods. In addition to displaying the measurement values in the standard numerical bar graph mode, the simulated analog needle, and the line graph, users can choose to display the real-time statistical values on the screen. Pass/fail criteria can be set up to display a warning sign. Scalable analog output is also featured. The device has a compact, ergonomic design, the case being made of molded high-impact plastic with an optimized-angle kickstand. Rubberized sides let it be gripped easily and protect against damage. The built-in USB and RS232 interfaces and PMManager personal computer (PC) software allow online processing of data or processing of previously stored data; results are displayed graphically on a PC. To support PC interfacing, LabVIEW drivers, component object model interface, and demo source code are provided. PMManager application software controls and takes measurement data out of the 1919-R meter. It turns a PC into a laser power multichannel analysis workstation. Software features include advanced
Nanostructure analysis x-ray system Rigaku has launched its NANOPIX measurement system, an x-ray scattering instrument designed for nanostructure analyses. It can be used for both small angle x-ray scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multiscale structures from subnanometer- to nano-order (0.1–100 nm). According to Rigaku, the NANOXPIX SAXS/WAXS Handheld optical power meter measurement system achieves the highest level of small angle resolution—Qmin to 0.02 nm−1—for a laboratory SAXS instrument. SAXS is a technique McPherson’s 1919-R advanced optical power and used to study nanoscale structures of atoms or energy meter can measure from picomolecules and their variation by measuring the watts to thousands of watts. It features a userdiffuse scattering from unequal electron density friendly screen layout for quick configuration of areas. SAXS experiments are performed in a measurement parameters at the main display. The wide range of fields from research and develop320 × 240-pixel, bright-color, thin-film-transistor ment (R&D) to quality control. The NANOPIX liquid-crystal display offers clear legibility and Reuse of AIP Publishing content is subject to the terms at: https://publishing.aip.org/authors/rights-and-permissions. Download to IP: 23.95.235.179 On: Mon, 11 Apr
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measurement processing and extensive graphic display of data: line plot, histogram, pulse chart, simulated analog needle, and multiple data sets on separate graphs on the same screen. It interfaces and supports data logging with the company’s devices.—Newport Corporation, 1791 Deere Avenue, Irvine, California 92606. (949-863-3144) http://www.newport.com
Near-IR detectors Opto Diode, an ITW company, developed its NXIR family of photodiodes for back-facet lasermonitoring applications that require improved performance in the near-IR spectrum from 700 nm to 1100 nm. The compact NXIR-RF36 and NXIRRF70 near-IR/red-enhanced models are suitable for integration with semiconductor lasers, notably Fabry–Perot, distributed feedback, and verticalcavity surface-emitting lasers. They have high responsivity of 0.65 A/W at 850 nm, low capacitance of 5 pF at 0 V, and shunt resistance >200 MΩ. The NXIR-RF36 has an active area of 0.36 mm2; the NXIR-RF70, of 0.70 mm2. A third device, the NXIR-5W, is optimal for high-power laser monitoring that requires higher responsivity in the near-IR spectrum. It can be used with yttrium aluminum garnet lasers in biological and medical equipment and in fluid dynamics and manufacturing applications. The NXIR-5W has high responsivity of 0.45 A/W at 1064 nm with low reverse bias voltage of 10 V, low dark current of 1 nA, and low capacitance of 10 pF. It is available in a hermetically sealed, standard two-lead TO-5 package.—Opto Diode Corporation, 1260 Calle Suerte, Camarillo, California 93012. (805-4990335) http://optodiode.com
Rev. Sci. Instrum. 87, 039501 (2016) high sensitivity, and low spurious signals, the MS27101A can reliably monitor low-level signals. Power consumption is typically 106 dB normalized to 1-Hz bandwidth, 20-MHz instantaneous bandwidth, Reuse of AIP Publishing content is subject to the terms at: https://publishing.aip.org/authors/rights-and-permissions. Download to IP: 23.95.235.179 On: Mon, 11 Apr
2016 22:37:43
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17025 and A2LA requirements.—Aalborg Instruments, 20 Corporate Drive, Orangeburg, New York 10962. (800-866-3837 and 845-770-3000) https://www.aalborg.com
NEW LITERATURE AND SOFTWARE Source measure unit (SMU) test and development software control Keysight Technologies has introduced a number of economical software control options for its B2900A series precision SMUs. The options give users access to a broad range of capabilities to support basic voltage and current sourcing up through full characterization of devices and materials. The SMU is typically used during the development or test of electronic devices when precision lowlevel sourcing and measuring is required. However, different applications demand different capabilities and generally, those capabilities come from the software used to control the SMU. While many SMU vendors offer software to control their products, according to the company they may not offer users flexibility in selecting among multiple software control options to meet their needs and budgets. By using one of the B2900A software control options, users eliminate the need to create their own software measurement environment and thus reduce their development and evaluation times.
Rev. Sci. Instrum. 87, 039501 (2016) That flexibility makes the B2900A SMUs suitable for many users, including university educators requiring solutions for student laboratories, circuit designers needing to integrate SMUs with other benchtop instruments, and R&D engineers needing an accurate current–voltage (I/V) characterization solution for devices and materials. Keysight’s software control options for the B2900A SMUs include the EasyEXPERT group+, which provides I/V parametric characterization for a wide range of devices and materials. The software is currently used in Keysight’s precision I/V analyzer products such as the B1500A, B1505A, and E5270B/E526xA. BenchVue enables benchtop integration of B2900A SMUs (as voltage/current sources) with other Keysight instruments such as oscilloscopes and meters. B2900A Quick I/V measurement software permits easy measurement setup and execution on a Windows-based PC via a user-friendly GUI. This control option supports all B2900 precision instrument family products, including SMUs, low-noise sources, and electrometers, and works on multiple interfaces such as local area network (LAN), USB, and general
purpose interface bus. Graphical web interface allows any Java-enabled web browser, such as Internet Explorer, to control B2900A SMUs over the LAN. Because special software is not required, this control option enables quick measurements on the fly.—Keysight Technologies, 1400 Fountaingrove Parkway, Santa Rosa, California 95403. (707-577-5030) http://www.keysight.com
Fluorescence lifetime spectrometer brochure PicoQuant has released a brochure covering the latest developments of its FluoTime 300 “EasyTau,” a fully automated fluorescence lifetime spectrometer with steady-state and phosphorescence options. The brochure presents an expanded range of accessories, among them newly designed sample mounting units. The 31-page document includes a complete description of the spectrometer system, all its accessories, and its software package. A series of methods and application examples detailed in the brochure demonstrate the capabilities of the fluorescence spectrometer.—PicoQuant, Rudower Chaussee 29, 12489 Berlin, Germany. (+49-306392-6929) https://www.picoquant.com
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