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curves for control-HaP, (b) low hysteresis of J-V curves for w/-PbI2-HaP, (c) ... on FTO. δ[100]h. PbI2 [001]t α[100]c δ[101]h α[110]c. -1.0 qxy (Å. -1. ) q z. (Å. -1. ).
Supplementary information for

Understanding how excess lead iodide precursor improves halide perovskite solar cell performance

Byung-wook Park et. al.

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(a)

(b)

Film type Au

Thickness (nm)

PTAA

20 - 50

HaP

350 - 650

mp-TiO2

80 – 200

d-TiO2

40 – 60

FTO

600 - 660

~ 80

Supplementary Figure 1 – Side-by-side comparison of morphology (a) and atomic number (b) contrast of the device cross section. The characteristic thickness of the various layers was not affected by the presence of excess of PbI2 in the deposition solution.

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Supplementary Figure 2 – Illustration of the fitting process to extract diffusion lengths.

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25

25

a

b Current density [mA/cm ]

20 2

2

Current density [mA/cm ]

20

Revers Forward

15

10

Voc (V)

1.05

1.03

Jsc(mA/cm2)

22.53

22.51

Fill factor (%) 76.22 46.77 10.82

Efficiency (%) 17.98

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Revers Forward

Control-HaP

0

Revers Forward

15

10

1.06

Voc (V)

1.10

Jsc(mA/cm2)

23.14 22.42

Fill factor (%) 77.27 80.86 Efficiency (%) 19.63 19.17

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Revers Forward

w/-PbI2-HaP

0 0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1.0

1.1

1.2

0.0

0.1

0.2

0.3

0.4

Potential [V]

22.7

0.8

22.2

EQE

0.4

Control-HaP w/PbI2-HaP 400

450

0.8

0.9

1.0

1.1

1.2

20

Control HaP w/-PbI2 HaP

16 14 12 10 8 6 4 2

0.0 350

0.7

18

mA/cm2

0.6

0.2

22

d

mA/cm2

The number of samples

c

0.6

Potential [V] 24

1.0

0.5

500

550

600

650

Wavelength [nm]

700

750

800

850

0 16.0

16.5

17.0

17.5

18.0

18.5

19.0

19.5

20.0

20.5

Solar cell efficiency [%]

Supplementary Figure 3. J-V curves for two representative HaP solar cells: (a) high hysteresis of J-V

curves for control-HaP, (b) low hysteresis of J-V curves for w/-PbI2-HaP, (c) External quantum efficiency for cells made with control- and w/-PbI2-HaP, and (d) Histogram of efficiencies for the

cells fabricated with and without excess PbI2. Details on the PV cell fabrication are given in the main text.

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Supplementary Figure 4 – Side by side SE and EBIC images of cross-sections of cells with (a) Control-HaP and (b) w/PbI2-HaP. The paths of the line profiles are marked with thin blue horizontal lines with arrows. The EBIC signal distributions are summarized in (c) and (d), for the two samples, using the results from the (a) and (b) images, respectively.

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α[300]c α[311]c α[220]c

α[310]c α[221]c

PbI2 [003]t

FTO

FTO

α[211]c

3.1

α[210]c δ[202]h

FTO δ[112]h

qz (Å-1)

α[200]c PbI2 [002]t α[111]c

α[110]c

FTO α[100]c

2.1

δ[101]h δ[201]h PbI2 [001]t

δ[002]h δ[100]h

0.1

-2.0

-1.0

0.0 qxy (Å-1)

δ[101]h

1.0

2.0

Supplementary Figure 5. Miller indexes on 2D GIWAXS pattern for FA cation-substituted HaP film

on FTO.

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Ek = 11.6 keV

Penetration Depth (nm)

100

10

1 0.0

0.1

0.2

0.3

0.4

0.5

o

Incidence angle, i ( ) Supplementary Figure 6. X-ray penetration depth to α-FAPbI3 film with x-ray incidence angles which

were reported previously.1

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a

B A

-FAPbI3 [100] -FAPbI3 [200]

Intensity [A. U.]

PbI2 [001]

PbI2 excess

Control sample 10

15

20

25

30

35

X-ray diffrection angle [2]

Supplementary Figure 7. Full (2θ range) XRD spectra for control-HaP and w/-PbI2-HaP films on

were done on a Rigaku D/MAX2500V/PC X-ray diffractometer bFTO. (XRD measurements PbI excess 2 2

Intensity [A. U.]

1

11.8

12.0

12.2

12.4

12.6

12.8

13.0

Control

13.2

13.4

12.0

Center 12.77725 12.85372

Area Peak 1: 210.15656 Peak 2: 211.0563

Center FWHM 12.7437 0.25172 12.80439 0.11217

FWHM 0.23873 0.1181

Height 692.1582 2003.76955

13.6

1

11.8

Area Peak 1: 207.09961 Peak 2: 296.58554

2

Intensity [A. U.]

PbI2 [001]h

at 40 kV, 200 mA with a Cu target.)

12.2

12.4

12.6

12.8

13.0

13.2

13.4

Height 666.13963 1501.33919

13.6

2

Intensity [A. U.]

PbI2 excess PbI excess 2

2 Area Peak 1: 1735.16897 Peak 2: 3011.67664

1

13.8

13.9

14.0

14.1

14.2

14.3

14.4

14.5

13.9

14.0

14.1

Area Peak 1: 2090.85529 Peak 2: 3589.83594

14.2

2

FWHM 0.2036 0.09152

Height 6800.04623 26254.88968

B

1

13.8

Center 14.18562 14.25265

14.6

2

Control Control

Intensity [A. U.]

HAP [100]c

c

14.3

14.4

14.5

Center 14.14002 14.19573

FWHM 0.20013 0.08493

Height 8335.87239 33726.02575

14.6

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(b)

Control-HaP

α-FAPbI3 [100]c

(a)

o

i = 0.15

w/-PbI2-HaP

α-FAPbI3 [100]c

o

i = 0.15 o

i = 0.2

o

Intensity (a.u.)

i = 0.2

Intensity (a.u.)

o

i = 0.3

0

20

40

60

80

o

i = 0.3

0

100 120 140 160 180

20

60

α-FAPbI3 [100]c

(d)

100 120 140 160 180

α-FAPbI3 [100]c

Substrate

Substrate Control-HaP

PbI2 [001]t

(e)

80

Azimuthal angle ( )

Azimuthal angle ( )

(c)

40

o

o

o

i = 0.15

(f)

PbI2 [001]t

w/-PbI2-HaP o

o

i = 0.15

o

i = 0.2

i = 0.2

0

20

40

60

80

100 120 140 160 180 o

Azimuthal angle ( )

Intensity (a.u.)

Intensity (a.u.)

i = 0.3

o o

i = 0.3

0

20

40

60

80

100 120 140 160 180 o

Azimuthal angle ( )

Supplementary Figure 8. (a and b) One-dimensional (1D) patterns of α-HaP [100]c at qxy of 1.0/Å, (c

and d) schemes of texturing of crystal domains for control- and w/-PbI2-HaP, and (e and f) 1D patterns of PbI2 [001]t at qxy of 0.9/Å obtained from 2D-GIWAXS (Fig. 3).

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Supplementary Figure 9. 2D GIWAXS images of as-prepared w/PbI2-HaP film observed over 6 s to

40 s with heating up to 150 °C.

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(a)

(b)

10 m

20 m

(c)

10 m

(d)

5 m

(2) (1)

Supplementary Figure 10. HR-TEM images (a) PbI2 located 200 nm deep from HaP film surface for

control-HaP, (b) α-HaP crystal orientation (blue: out-of-plane, red: in-plane), and (c and d) magnified images for the remnant PbI2.

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(a)

Area β

Area α 200 m

Area α

(b)

(c) Area β TiO2

A B 10 m

5 m

HaP

Supplementary Figure 11. HR-TEM images (a) low-magnified image for w/-PbI2-HaP, (b) magnified

image of area  for δ-HaP located between PbI2 and α-HaP phase, (c) magnified image of area  for the observation of interface between TiO2 and HaP in w/PbI2 sample.

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Control HaP precursor

PbI2 excessed HaP precursor

Supplementary Figure 12. Comparison of size and distribution of iodoplumbate complex measured

by dynamic light scattering spectroscopy in control and w/PbI2 precursor solution.

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Supplementary References (1) Liu, J., Saw, Robert E., Kiang, Y.-H., Calculation of Effective Penetration Depth in X-Ray Diffraction for Pharmaceutical Solids, J. Pharm. Sci. 99, 3807–3814 (2010).

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