Supporting Information: Chemical Synthesis of Multilayered Nanostructured Perovskite Thin Films with Dielectric Features for Electric Capacitors Mohamed Barakat Zakaria,1,2* Takahiro Nagata,1 Asahiko Matsuda,3 Yudai Yasuhara,1,4 Atsushi Ogura,4 Md. Shahriar A. Hossain,5 Motasim Billah,5 Yusuke Yamauchi,6,7* and Toyohiro Chikyow1,3,4*
1
International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
2
Department of Chemistry, Faculty of Science, Tanta University, Tanta, Gharbeya 31527, Egypt
3
Materials Data & Integrated System (MaDIS), National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
4
Graduate School of Science and Technology, Meiji University, Kawasaki, 214-8571, Japan
5
School of Chemistry & Australian Institute for Innovative Materials (AIIM), University of Wollongong, Squires Way, North Wollongong, NSW 2500, Australia
6
Department of Plant & Environmental New Resources, Kyung Hee University, 1732 Deogyeong-daero, Giheunggu, Yongin-si, Gyeonggi-do 446-701, South Korea
7
School of Chemical Engineering & Australian Institute for Bioengineering and Nanotechnology (AIBN), The University of Queensland, Brisbane, QLD 4072, Australia
Emails: T.C.
[email protected] M.B.Z.
[email protected];
[email protected]; Y.Y.
[email protected]
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Figure S1
Figure S1 Top-surface SEM images of STO obtained at a) 400, b) 500, c) 600, d) 700, e) 800, and f) 900 ○C on silicon substrate.
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Figure S2
Figure S2 Top-surface SEM images of BTO obtained at a) 400, b) 500, c) 600, d) 700, e) 800, and f) 900 ○C on silicon substrate.
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Figure S3
Figure S3 Cross-sectional SEM image of BTO obtained at 800 ○C on Si/SiO2/Ti/Pt substrate.
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Figure S4
Figure S4 a) Top-surface SEM image of STO/BTO and cross-sectional SEM images of b) STO and c) STO/BTO obtained at 800○C on silicon substrate.
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Figure S5
Figure S5 Wide-angle XRD patterns of STO powders obtained at different temperatures.
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Figure S6
Figure S6 a) HAADF-STEM image and the corresponding elemental mapping images of STO obtained at 800 ○C on Si/SiO2/Ti/Pt substrate.
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Figure S7
Figure S7 a) Energy-dispersive X-ray spectroscopy (EDX) results: SEM image and the corresponding elemental mapping images of STO/BTO obtained at 800 ○C on Si/SiO2/Ti/Pt substrate.
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Figure S8
Figure S8 a) HAADF-STEM image and the corresponding elemental mapping images of STO/BTO obtained at 800 ○C on Si/SiO2/Ti/Pt substrate.
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Figure S9
Figure S9 C-V measurements curves of the multilayered STO/BTO obtained at 800 ○C on Si/SiO2/Ti/Pt substrate at different frequencies.
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Figure S10
a)
Intensity (a.u.)
STO/BTO
Bulk BTO
Bulk STO
Intensity (a.u.)
b) STO/BTO
Bulk BTO 0
100
200 300 400 500 600 Raman shift (cm -1 )
700 800
Figure S10 a) Unpolarized Raman spectrum of the bilayer STO/BTO composite calcined at 1000 ºC. Reference spectra of pure BTO and STO crystals without mesoporous structures are also included. Folded acoustic phonon modes are marked by arrows. b) Polarized Raman spectra for both the bilayer STO/BTO composite calcined at 1000 ºC and bulk BTO crystal. Pure BTO and STO crystals were purchased from Fujikura Ltd. and Shinkosha Co., Ltd., respectively.1
References: 1.
Suzuki, N.; Zakaria, M. B.; Torad, N. L.; Wu, K. C.; Nemoto, Y.; Imura, M.; Osada,
M.; Yamauchi, Y. Synthesis of Highly Strained Mesostructured SrTiO3/BaTiO3 Composite Films with Robust Ferroelectricity. Chem.-Eur. J. 2013, 19, 4446. S11
