XRD and TEM Characterization of Compound ...

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advantage of producing solid solutions by organometallic precursor decomposition is ... performed on personal computers using MD1 Jade software. ... Diffraction patterns of SnS, Sn(So.s Seo.s), and SnSe, showing typical solid solution.
XRD and TEM Characterization of Compound Semiconductor Solid Solutions: Sn(S,Se) and (Pb,Cd)S B.R. Jarabek., D.G. Grier., D.L. Simonson, Center for Main Department North Dakota Fargo, ND

D.J. Seidler, P. Boudjouk Group Chemistry of Chemistry State University 58 105-55 16

and G.J. McCarthy

L.P. Keller MVA Inc. 5500 Oakbrook Pkwy., Suite 200 Norcross, GA 30093

Abstract X-ray powder diffraction (XRD) is an essential component of research into use of organometallic precursors as a route to low temperature (